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        1. 泰州巨納新能源有限公司
          中級會員 | 第3年

          13651969369

          當(dāng)前位置:泰州巨納新能源有限公司>>二維材料>>二維材料薄膜>> 基于藍(lán)寶石襯底的全區(qū)域覆蓋的單層二硒化鎢

          基于藍(lán)寶石襯底的全區(qū)域覆蓋的單層二硒化鎢

          參   考   價: 6979.7

          訂  貨  量: ≥1 片

          具體成交價以合同協(xié)議為準(zhǔn)

          產(chǎn)品型號

          品       牌2D Semiconductors

          廠商性質(zhì)生產(chǎn)商

          所  在  地泰州市

          更新時間:2024-06-03 19:22:35瀏覽次數(shù):659次

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          This product contains full area coverage WSe2 monolayers on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick WSe2 sheet.

          This product contains full area coverage WSe2 monolayers on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains monolayer thick WSe2 sheet. Synthesized full area coverage monolayer WSe2 is highly luminescent and Raman spectroscopy studies also confirm the monolayer thickness (please see the technical specifications)



          Sample Properties.

          Sample size

          1cm x 1cm square shaped

          Substrate type

          Sapphire c-cut (0001)

          Coverage

          Full monolayer coverage

          Electrical properties

                 1.62 eV Direct Bandgap Semiconductor

          Crystal structure

          Hexagonal Phase

          Unit cell parameters

          a = b = 0.327 nm, c = 1.295 nm, α = β = 90°, γ = 120°

          Production method

          Low pressure Chemical Vapor Deposition (LPCVD)

          Characterization methods

          Raman, photoluminescence, TEM, EDS



          Specifications

          1)    Identification. Full coverage 100% monolayer WSe2 uniformly covered across c-cut sapphire

          2)    Physical dimensions. One centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.

          3)    Smoothness. Atomically smooth surface with roughness < 0.15 nm.

          4)    Uniformity. Highly uniform surface morphology. WSe2 monolayers uniformly cover across the sample.

          5)    Purity. 99.9995% purity as determined by nano-SIMS measurements

          6)    Reliability. Repeatable Raman and photoluminescence response

          7)    Crystallinity. High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.

          8)    Substrate. c-cut Sapphire but our research and development team can transfer WSe2 monolayers onto variety of substrates including PET, quartz, and SiO2/Si without significant compromisation of material quality.

          9)    Defect profile. WSe2 monolayers do not contain intentional dopants or defects. However, our technical staff can produce defected WSe2 using α-bombardment technique.


          Supporting datasets [Full area coverage monolayer WSe2 on c-cut Sapphire]


          Transmission electron images (TEM) acquired from CVD grown full area coverage WSe2 monolayers on c-cut sapphire confirming highly crystalline nature of monolayers


          Room temperature photoluminescence spectroscopy (PL) and Raman spectroscopy (Raman) measurements performed on CVD grown full area coverage monolayer WSe2 on c-cut sapphire. Raman spectroscopy measurement confirm monolayer nature of the CVD grown samples and PL spectrum display sharp and bright PL peak located at 1.67 eV in agreement with the literature.


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